- Ensure precise testing and aging of QFP64, LQFP64, and TQFP64 chips with our reliable Burn-In Socket, designed for optimal stability and performance. - The robust socket design guarantees secure connections, essential for accurate chip testing and efficient long-duration aging tests. - Ideal for semiconductor engineers, electronic lab technicians, and professionals seeking high-quality tools for chip testing and aging processes. - Perfect for use in electronics manufacturing workshops conducting batch aging tests, as well as laboratories assessing chip performance and long-term reliability. Key Features: - Compatibility: Specifically designed for QFP64, LQFP64, and TQFP64 chip types. - Functionality: Facilitates precise testing and aging processes, ensuring chip reliability. - Performance: Optimized for extended aging tests, providing consistent results and stability. Use Scenarios: 1. In an electronics manufacturing facility, use the Burn-In Socket to conduct rigorous aging tests on batches of QFP64 chips, ensuring only the most reliable components proceed to assembly. 2. In a research lab, employ the socket to assess the performance of LQFP64 chips under prolonged stress, helping to validate their durability for critical applications. This Burn-In Socket is an indispensable tool for professionals in the electronics field, delivering exceptional reliability and performance for chip testing and aging.