1) Smart Safety Features Automatic discharge of non-chargeable capacitors after insertion helps prevent safety risks, with an intelligent anti-scalding mechanism to reduce operator exposure in practical use scenarios. This feature enhances safe operation without compromising testing capability. 2) Convenient Computer Integration Data can be exported via computer connectivity, enabling more comprehensive evaluation of transistor testing results. The integration supports efficient analysis and streamlined documentation of test outcomes. 3) Multiple Measurement Modes Interchangeable test cards and multiple measurement modes provide dependable performance and adaptability for varied transistor testing tasks. The system accommodates different transistor types and testing requirements with flexible configurations. 4) Time-Saving Identification Intelligent component identification allows quick parameter detection through simple plug-and-unplug actions, reducing setup time and maintaining accuracy for every test session. The workflow is streamlined to minimize operator effort. Practical use scenarios - Research and development lab: Characterize newly developed transistors quickly by switching between interchangeable test cards and recording parameters, with easy data export for report generation. - Production quality control: On the manufacturing line, rapidly verify transistor parameters, save test records to a computer, and ensure consistent results across batches. - Educational or training environment: Demonstrate safe transistor testing practices with automatic capacitor handling, while teaching students how to identify components and interpret test parameters through straightforward plug-and-play operations.